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NewBie said:
Another concern is code corruption by particles that are found in nature, upsetting the cells that contain the 1's and 0's. It is much worse at higher altitudes and even more a concern for aircraft. As electronics shrink (the silicon die inside), to more recent and ever decreasing sizes, and especially with multi-level storage technologies, the likelyhood of individual cell upset evens rises significantly, to the point that even FPGA's running "code" have been a serious topic of discussion amongst EE's in Aviation, such that it has spilled into the mainstream EE Magazines a few times.
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This so-called "single event upset" (SEU for short) plagues mainly static memory cells (FPGA's from the big two use SRAM based cells) and not flash memory if memory serves me right, no pun intended. As paulr stated, this includes DRAM. SEU's are predominantly seen in space applications though higher altitude does come into play. Since the code set is in flash memory, I wouldn't worry about SEU.
As far as long term storage, why not use the Arc as Peter intended it to be? It's a tool, nothing else. You guys paid close to $200 for it, why not get your money's worth out of it. It's like buying Snap-On tools and then stashing it in the cabinet, never to be used because the mechanic is afraid of marring it or scratching it.
CM